Reflectance Models with Fast Importance Sampling

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dc.contributor.authorNeumann, Laszloen_US
dc.contributor.authorNeumann, Attilaen_US
dc.contributor.authorSzirmay-Kalos, Laszloen_US
dc.date.accessioned2015-02-16T06:59:12Z
dc.date.available2015-02-16T06:59:12Z
dc.date.issued1999en_US
dc.description.abstractWe introduce a physically plausible mathematical model for a large class of BRDFs. The new model is as simple as the well-known Phong model, but eliminates its disadvantages. It gives a good visual approximation for many practical materials: coated metals, plastics, ceramics, retro-reflective paints, anisotropic and retro-reflective materials, etc. Because of its illustrative properties it can be used easily in most commercial software and because of its low computational cost it is practical for virtual reality. The model is based on a special basic BRDF definition, which meets the requirements of reciprocity and of energy conservation. Then a class of BRDFs is constructed from this basic BRDF with different weight functions. The definition of such weight functions requires the user to specify the profile of the highlights, from which the weight function is obtained by derivation. It is also demonstrated how importance sampling can be used with the new BRDFs.en_US
dc.description.number4en_US
dc.description.seriesinformationComputer Graphics Forumen_US
dc.description.volume18en_US
dc.identifier.doi10.1111/1467-8659.00378en_US
dc.identifier.issn1467-8659en_US
dc.identifier.pages249-265en_US
dc.identifier.urihttps://doi.org/10.1111/1467-8659.00378en_US
dc.publisherBlackwell Publishers Ltd and the Eurographics Associationen_US
dc.titleReflectance Models with Fast Importance Samplingen_US
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