Reflectometer Material Capture
| dc.contributor.author | Chan, Danny | en_US |
| dc.contributor.author | Iwanicki, Michal | en_US |
| dc.contributor.editor | Hardeberg, Jon Yngve | en_US |
| dc.contributor.editor | Rushmeier, Holly | en_US |
| dc.date.accessioned | 2024-08-28T06:32:00Z | |
| dc.date.available | 2024-08-28T06:32:00Z | |
| dc.date.issued | 2024 | |
| dc.description.abstract | Physically-based shaders benefit from physically measured material parameters. The Reflectometer is a simple-to-build, portable device that allows measurement of diffuse albedo, smoothness, and specular F0 in the field. | en_US |
| dc.description.sectionheaders | Representation / Capture / Wave Optics | |
| dc.description.seriesinformation | Workshop on Material Appearance Modeling | |
| dc.description.seriesinformation | Joint MAM - MANER Conference - Material Appearance Network for Education and Research | |
| dc.identifier.doi | 10.2312/mam.20241179 | |
| dc.identifier.isbn | 978-3-03868-264-6 | |
| dc.identifier.issn | 2309-5059 | |
| dc.identifier.pages | 4 pages | |
| dc.identifier.uri | https://doi.org/10.2312/mam.20241179 | |
| dc.identifier.uri | https://diglib.eg.org/handle/10.2312/mam20241179 | |
| dc.publisher | The Eurographics Association | en_US |
| dc.rights | Attribution 4.0 International License | |
| dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | |
| dc.title | Reflectometer Material Capture | en_US |
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