Reflectometer Material Capture

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mam20241179.pdf (9.33 MB)
Date
2024
Authors
Chan, Danny
Iwanicki, Michal
Journal Title
Journal ISSN
Volume Title
Publisher
The Eurographics Association
Abstract
Physically-based shaders benefit from physically measured material parameters. The Reflectometer is a simple-to-build, portable device that allows measurement of diffuse albedo, smoothness, and specular F0 in the field.
Description

        
@inproceedings{
10.2312:mam.20241179
,
booktitle = {
Workshop on Material Appearance Modeling
Joint MAM - MANER Conference - Material Appearance Network for Education and Research
},
editor = {
Hardeberg, Jon Yngve
 and 
Rushmeier, Holly
},
title = {{
Reflectometer Material Capture
}},
author = {
Chan, Danny
 and 
Iwanicki, Michal
},
year = {
2024
},
publisher = {
The Eurographics Association
},
ISSN = {
2309-5059
},
ISBN = {
978-3-03868-264-6
},
DOI = {
10.2312/mam.20241179
}
}

@inproceedings{
10.2312:mam.20241179
,
booktitle = {
Workshop on Material Appearance Modeling
Joint MAM - MANER Conference - Material Appearance Network for Education and Research
},
editor = {
Hardeberg, Jon Yngve
 and 
Rushmeier, Holly
},
title = {{
Reflectometer Material Capture
}},
author = {
Chan, Danny
 and 
Iwanicki, Michal
},
year = {
2024
},
publisher = {
The Eurographics Association
},
ISSN = {
2309-5059
},
ISBN = {
978-3-03868-264-6
},
DOI = {
10.2312/mam.20241179
}
}
Citation
URI
https://doi.org/10.2312/mam.20241179
 https://diglib.eg.org/handle/10.2312/mam20241179
Collections
MAM2024 - MANER Conference London 2024